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Atomic Force Microscope - AFM, Scanning Probe Microscopes - SPM, Profilometer, & Interferometer Metrology. Whether you are a researcher looking to measure: surface flatness, surface waviness, surface quality, surface topography, and/or surface characterization, we address surface finish metrology measurement for a variety of results achieved via surface scanning of substrates, surface texture management, surface imaging, and surface technology. Acting as a surface roughness gauge, tester and inspection system; our surface technology utilizes the highest level of industry parameters and standards.