XP-1 Features Include:

  • Linear-scan stage technology and precision optical flat (flat to 6 Angstroms per millimeter) ensure the highest precision measurements. Step height repeatability is guaranteed to be 10Å or 0.1% of nominal step, whichever is greater.
  • 140mm diameter manual sample stage and 30mm maximum sample height accommodates many different sample sizes and shapes.
  • User-adjustable force control mechanism and proprietary optical deflection height-measurement sensor represent a major advance in state-of-the-art surface profiling technology. The XP-1 has the lowest mass and inertia stylus assembly to minimize tip/sample interaction with stylus loads as low as 0.05mg.


  • High resolution measurements are never compromised with the XP-1. Step height repeatability is guaranteed to be 10A or 0.1% of the nominal value, whichever is greater.
  • Fixed 100X magnification color camera (Motorized zoom optical assembly is available as an option).
  • Up to 60,000 data point per scan line (regardless of scan length) data collection means that your lateral resolution is always tip limited.
  • Windows XP graphical user interface, TFT Flat Panel Monitor, and USB communications protocol gives you simple sample navigation, image capture, data analysis, printing and export.
  • Software updates are free for the life of the instrument.
Related Documents: