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Atomic Force Microscope | AFM | SPM | Microscopy Microscopes
ATOMIC FORCE MICROSCOPES / SCANNING PROBE MICROSCOPES /(AFM/SPM)
Q-Scope™ | Scanning Probe Microscope
The Q-Scope™ family of Scanning Probe Microscope (SPM) features a totally modular design approach which delivers unmatched versatility and utility. Common to all models are the Q-Scan™ interchangeable scan head and our proprietary DSP control electronics. Standard Q-Scope models can then be configured using various sample stages, bases, software and scan accessories to tailor a specific instrument configuration to meet an individual customer’s application requirements.
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Universal SPM | Scanning Probe Microscope
The Universal SPM (USPM) instrument differs from the original Q-Scope™ product family in that it rasters the sample beneath a fixed probe. This system is designed for both AFM and STM measurements on small samples with atomic-scale resolution. The USPM is available as a complete stand-alone system, combined with a Q-Scope, or as an upgrade to an existing Q-Scope.
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Accessories, Options, and Supplies
Ambios is dedicated to providing innovative and affordable SPM tools for academic and industrial researchers. Optional equipment available for our SPMs ranges from closed-loop metrology scanners to Nanolithography software, or from combined SPM/Hysitron tribology capabilities to liquid cells and cantilevers, Ambios SPM products are designed for upgrades and changing experimental requirements. Whether your application is in surface science, optics, microelectronics, chemistry or biology, there is a Ambios SPM for the job at a price that makes sense.
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