Atomic Force Microscope | AFM | SPM | Microscopy Microscopes
Atomic Force Microscope | AFM | SPM | Microscopy  Microscopes
  • SPM/AFM
  • - Q-View
  • - Q-Scope Series
  • - Universal SPM
  • - Accessories
  • Profilometer
  • - XP-Plus Series
  • - XP-Plus 300
  • - XP-Plus 200
  • - XP-Plus 100
  • Interferometers
  • - Xi-100 Plus
  • Software Highlights
  • Image Gallery
  • Applications

ATOMIC FORCE MICROSCOPES / SCANNING PROBE MICROSCOPES (AFM/SPM)


Atomic Force Microscope | AFM | SPM | with Interferometry

Q-View™ | Atomic Force Microscope (AFM/SPM) with Interferometer Module

Q-View is a micro-interferometer module that has been seamlessly integrated into the Q-Scope SPM. This combination provides two synergistic technologies on a single platform. The interferometer mode allows the user to scan a 500um image with nanometer resolution in seconds; switch to SPM mode and zoom in on an area of interest and take a sub-angstrom high resolution image.

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Atomic Force Microscope | AFM | SPM | Microscopy  Microscopes

Q-Scope™ | Scanning Probe Microscope

The Q-Scope™ family of Scanning Probe Microscope (SPM) features a totally modular design approach which delivers unmatched versatility and utility. Common to all models are the Q-Scan™ interchangeable scan head and our proprietary DSP control electronics. Standard Q-Scope models can then be configured using various sample stages, bases, software and scan accessories to tailor a specific instrument configuration to meet an individual customer's application requirements.

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Scanning Probe Microscope | SPM | Microscopy  Microscopes

Universal SPM | Scanning Probe Microscope

The Universal SPM (USPM) instrument differs from the original Q-Scope™ product family in that it rasters the sample beneath a fixed probe. This system is designed for both AFM and STM measurements on small samples with atomic-scale resolution. The USPM is available as a complete stand-alone system, combined with a Q-Scope, or as an upgrade to an existing Q-Scope.

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Atomic Force Microscope | AFM | SPM | Microscopy  Microscopes Accessories & Equipment

Accessories, Options, and Supplies

Ambios is dedicated to providing innovative and affordable SPM tools for academic and industrial researchers. Optional equipment available for our SPMs ranges from closed-loop metrology scanners to Nanolithography software, or from combined SPM/Hysitron tribology capabilities to liquid cells and cantilevers. Ambios SPM products are designed for upgrades and changing experimental requirements. Whether your application is in surface science, optics, microelectronics, chemistry or biology, there is an Ambios SPM for the job at a price that makes sense.

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Atomic Force Microscope | AFM | SPM | Microscopy Microscopes