Atomic Force Microscope | AFM | SPM | Accessories & Equipment

Profilometer & Interferometer Surface Roughness Measurement

ACCESSORIES, OPTIONS, AND SUPPLIES

Pre-mounted Cantilevers

Cantilevers for Ambios Q-Scopes are conveniently mounted on stainless steel tabs for quick and easy replacement. Ambios supplies probes for all available imaging modes as well as supplying different aspect ratio probes. Contact your nearest representative for details.

Acoustic/Vibration Isolation System | Atomic Force Microscope Accessories | Images

New Isochamber™ Acoustic/Vibration Isolation System

Ambios offers two means of isolating your SPM from building vibrations, interior acoustic noise, and thermal drift caused by room air movement. The high performance IsochamberTM features an integral Minus K Technology negative-stiffness isolator which offers 1.5Hz horizontal and 0.5Hz vertical natural frequencies. The economical AVIC model is a less expensive option where isolation is achieved by placing the microscope onto a heavy mass supported by soft springs within a closed chamber.
(Enlarged Photos) (Info Sheet-pdf) (Press Release)

Metrology Scanners

This option to the 80um scanner for either the Q-Scope or U-SPM Models adds an active feedback positioning system to all three axes of motion. This approach results in scans which are 99.8% accurate in X and Y and 99% accurate in Z.

NanoLithography

This optional software provides both a program window within the Ambios ScanAtomic control environment to create lithography processes with an easy to use script language, and a .dll link component which allows external programs (Visual Basic or C++) to control the SPM system via lithography function calls. Very powerful macro control programs may be created in this way.

NanoIndentation

Ambios offers a unique scan module designed for use with the Hysitron™ Triboscope nanomechanical tester. This interface module provides a full test platform for the quantitative determination of a surface's nanomechanical properties combined with the AFM's high resolution 3D imaging capability.

Scanning in Liquids

Using this option with either the Q-Scope or U-SPM Models, AFM scans can be performed under liquids. Liquid scanning is possible with both contact and intermittent-contact scanning modes

Sample Heater

Available option for the Q-Scope which allows samples to be imaged at elevated temperatures to 250 C via a digital temperature controller.

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See Accessories Brochure (pdf)