Carbon Black Dispersion Measurement via Interferometric Microscopy

 

Old reliable technology – New exciting application

 

History of Dispersion Measurement [1]

   Characterization of the filler dispersion within a rubber compound has been of documented interest for nearly a century due to the need for compound mixing optimization. Over-mixing increases the compound cost while poor filler dispersion decreases product lifetimes and can cause catastrophic failure in extreme cases. One of the oldest and most fundamental techniques for characterizing filler dispersion is analysis of microtomed thin sections with light microscopy. The use of this technique is limited, however, by the required microtoming, which is labor and time intensive and is not suitable for routine, quick analyses. Faster and relatively inexpensive methods for characterizing filler dispersion rely on surface roughness created when samples are razor cut. The main advantage of these techniques is the ease of sample preparation, however, it is often difficult to quantify the resulting surface roughness of the sample.

 

New Innovations

   To combine the quantitative results from light microscopy with the speed of the surface roughness techniques, the method of interferometric microscopy (IFM) has been applied to carbon black dispersion characterization in vulcanized elastomeric systems by Columbian Chemicals Company [1] and the resulting technique has been licensed to Ambios Technology.

Text Box: Figure 1 3D Topographic Information of a rubber sample containing carbon black   The Ambios Xi-100 IFM uses white light interference to generate a three-dimensional topographic map of the razor cut rubber surface (See Figure 1). The peaks and valleys observed in this figure correspond to the undispersed carbon black agglomerates within the sample. Based on this surface topography, data analysis techniques are utilized to characterize the surface roughness, and carbon black dispersion. IFM results from carbon black compounds correlate extremely well (R2=0.954) with those obtained via light microscopy according to the study by Columbian[1]. Although the initial correlation was performed for carbon black only samples, this technique can be applied to other fillers besides carbon black. 


Interferometric Microscope Characterization

   Once the Xi-100 topographic map of the sample is obtained, the analysis software is used to isolate, define and characterize the peaks and valleys found on the sample surface. The acquired topographic maps often have long-range variation of the sample surface, which interferes with identification of the peaks associated with the carbon black agglomerates. To remove this long-range variation, the as-acquired data is processed using a band-pass Fast Fourier Transform filter and the height scale origin is set to the mean height of the image.

Text Box: Figure 2 Identification of carbon black agglomerates, shown as colored areas.   The next step is to isolate the surface features and quantify them. Since the base surface of the data has been flattened and set to zero, setting a minimum height displacement from the image mean plane can identify the peaks (positive height) and valleys (negative height) present in the data (See Figure 2). Parameters to describe the carbon black agglomeration such as the number of peaks, the peak area, the aspect ratio of each peak, and the height of each peak, as well as others are obtained and cataloged by our program. The ability of the Xi-100 to provide true three-dimensional topographic information is invaluable for carbon black dispersion characterization.

 

Sample Preparation and Processing

   A key factor to this technique is a measurement time of only minutes. A rubber sample is placed in a guillotine sample cutter and cut with a razor blade, exposing the peaks and valleys due to the undispersed carbon black agglomerates. The fresh-cut surface is then placed under the Xi-100 objective and quickly scanned. The customizable software enables the user to automate the acquisition of several measurements using a motorized stage. The topographic data from each measurement location is then automatically processed and the surface roughness characterized. Finally, a printable report is generated displaying 3D images of the sample, the dispersion index, roughness, and many other key statistics.

 

Primary Reference:

[1] Carbon Black Dispersion Measurement in Rubber Vulcanizates Via Interferometric Microscopy

Rubber Chemistry and Technology Vol. 77 Num. 4 pg. 691-710 Sept – Oct 2004.

 

Ambios Technology

 

100 Pioneer Street

Santa Cruz, CA 95060

Ph: 831-429-4200

Fax: 831-427-1160

 

www.AmbiosTech.com

info@ambiostech.com

 

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