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A Profilometer & Interferometer manufacturer, Ambios Technology. Whether you are a researcher looking to measure: surface flatness, surface waviness, surface quality, surface topography, and/or surface characterization, the XP profilometer addresses surface finish metrology measurement for a variety of results achieved via surface scanning of substrates, surface texture management, surface imaging, and surface technology. Acting as a surface roughness gauge, tester and inspection system; our surface technology utilizes the highest level of industry parameters and standards.
The XP and Xi-100 are profilometer measurement tools in the Micro-Electro-Mechanical Systems (MEMS) industry, in MEMS applications, and MEMS metrology using technology equipment for semiconductor and wafer surface metrology.
The XP profilometer equipment is a precision industrial metrology technology instrument, precision metrics tool, inspection apparatus, product resource system and solution offering metrology calibration instrumentation for height measurement; ra surface finish roughness, rms surface finish roughness and rz surface finish testing.
Metrology Definition: (mètro'logy) noun 1. The science of weights and measures. 2. A system of weights and measures. Definition from: The Oxford Dictionary, Sixth edition, 1978