April 11, 2008 -- Ambios Technology, Inc. Grows to Meet
Expanding Nanotechnology Market
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 (Santa Cruz, CA) - Ambios Technology, Inc. announced today
that it has entered into a multi-year agreement doubling the size of its Santa
Cruz headquarters. The additional space will be used to substantially increase
manufacturing, engineering and research facilities. Ambios Technology makes
surface measurement and visualization instruments, including atomic force
microscopes, stylus-type profilometers, and scanning white light
interferometers. These instruments are the "eyes" of the high-resolution
research and nanotechnology industry.
According to Cientifica Ltd., a
UK based nanotech market research firm, the nanotech marketplace excluding
semiconductors and microelectronics is expected to grow 36%, annually through
2012. Growth in this market is further substantiated by the U.S. Department of
Labor's strategic plan for fiscal years 2006-2011 which stated, "…growth
in emerging fields such as nanotechnology - will accelerate in the coming
decades."
"Our steady twenty plus percent growth per year is largely
attributable to our access to the emerging nanotechnology market," according to
Patrick O'Hara, President and CEO of Ambios Technology. "Increased spending in
government, academic and industrial research in nanotechnology has lead to
increased revenue for Ambios Technology. As a result, we needed to expand our
facilities to meet the needs of our customers in this and other
markets."
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October 19,
2007 -- Ambios Technology Introduces Next Generation
Surface Profilometer
Product Line
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SANTA CRUZ, CA - Ambios Technology,
Inc. introduced its new family of surface profilometers at the 54th annual
American Vacuum Society conference in Seattle. The XP-Plus Series Profilers
feature entirely new control electronics, software, and substantially improved
performance specifications. The series consists of three different profilers,
each designed to meet the diverse needs of research and manufacturing
environments. For more information, visit
www.AmbiosTech.com/XP-Plus.html
Patrick O'Hara, President and CEO for the company commented, "These new
instruments represent a substantial advancement in the state-of-the-art in
surface profilometers. The new XP-Plus series is the culmination of nearly two
years of research, product development, and field testing. Our customers' input
was the impetus for the XP-Plus Series products, and is reflected in the
features and performance of these next-generation products from Ambios. With
this next generation product line, Ambios builds upon its industry reputation
as the preferred provider of high resolution surface profilers."
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Ambios Technology, Inc. is a manufacturer
of high resolution surface measurement and visualization
systems. In addition to
surface profilometers, the company manufactures
scanning white light interferometers and (AFM/SPM) scanning probe microscopes. A privately
held company, Ambios Technology, has its headquarters in Santa Cruz, CA and a
sales, service, and support office in Rochester, NY.
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October 17, 2007 - An Interview with Patrick O Hara, CEO,
Ambios Technology, Inc.
By
S.Vidyasankar, Senior Research Analyst, Frost & Sullivan
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Ambios Technology,
Inc. is an emerging player in the dimensional metrology market and was founded
in 1996. The company designs and manufactures innovative surface metrology
instruments for the industrial sectors and academic set-ups.
In this
Movers & Shakers interview, Mr. Patrick O'Hara, CEO of Ambios Technology,
Inc. shares his views with S.Vidyasankar, Senior Research Analyst, Frost &
Sullivan, on the metrology market space and what we can expect from Ambios Tech
in the future. (Complete article
here). |
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October 26, 2006 -- Ambios Technology, Inc. Releases New
Isochamber
Environmental Isolation System
Designed for Optimizing Performance of AFM and Other Surface Imaging
Tools
SANTA CRUZ, CA - In recent years, advances in micro and
nano technologies have been changing the landscape in virtually every industry,
from aerospace and defense, to biotech and energy. Benchtop instrumentation
that is capable of visualizing, these nanostructures, such as
Atomic Force
Microscopes is enabling on-going advancement in these critical fields of
study and development.
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Factors limiting the nanoscale performance and resolution of
these imaging and metrology instruments include mechanical, acoustic and
thermal noise introduced by ordinary laboratory environments. Proper
environmental isolation is essential for getting top performance from these
tools.
Ambios now offers a superior environmental chamber for
isolating high resolution metrology instrumentation from building vibrations,
interior acoustic noise, and thermally induced drift. The new Isochamber
provides 30dB of acoustic isolation, and features an integral 0.5Hz vibration
isolation platform from Minus K Technology. This translates to better than 99%
isolation efficiency acoustically and mechanically in key frequency regimes.
(See the Isochamber Info Sheet - pdf)
Ambios Technology, Inc., Established in 1996, is a
manufacturer of high performance, low cost bench top metrology measurement
equipment for the academic and general industrial research marketplaces. The
company is headquartered in Santa Cruz, California, USA.
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February 7, 2006--Ambios Technology, Inc.
Acquires Quesant Instrument Corp
Adds Scanning
Probe Microscopes to Product Line
SANTA CRUZ, CA - Ambios Technology, Inc. announced that it has
acquired the assets of Quesant Instrument Corporation. Ambios Technology, a
manufacturer of high resolution stylus and optical surface profiling systems
for the academic and industrial research markets, expands its product offering
with the addition of Quesants’
scanning
probe microscopes.
Scanning probe microscopes provide atomic scale resolution of
surfaces over fields of view from nanometers to 100 microns. The combination of
scanning probe techniques from Quesant and the existing products from Ambios
allows the combined company to provide one of the most diverse set of nanoscale
surface analysis and visualization products available from a single supplier.
Patrick O'Hara, President and CEO of Ambios commented, "With
more than 400 customers worldwide and a history of pioneering and innovative
technology development, Quesant brings to our product offering a set of highly
robust scanning probe microscopes that extends our vision for surface
measurement and analysis well into the nanoscopic regime. We are absolutely
delighted to welcome our colleagues from Quesant into the larger Ambios family
and look forward to ever greater innovation from our combined efforts."
As part of the acquisition, multiple patents related to some
of the most fundamental operating principles of scanning probe microscopy,
including Quesants’ patented isotopic focal system are assigned to Ambios,
as well as, inventory, fixed assets, product designs, and other non-tangible
assets. Ambios is totally committed to providing continued product service and
support to customers of existing Quesant products.
Commenting on the acquisition, Dr. Robert Harp, President of
Quesant said, "I am very proud of the contributions that Quesant has made to
the state-of-the-art of scanning probe microscopy as evidenced by our multiple
patents and diverse product offering. Ambios provides a way for us to access
broader markets in a more efficient manner. The combined company possesses the
promise of a great scientific instrument company, and we look forward to
working together in the fulfillment of that promise."
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mixture are affected by this Dispersion Index, including
tensile
strength, tear strength, fatigue and abrasion resisitance.
This new measurement capability was highlighted in the January
2006
issue of the industry publication Rubber World.
See the article version in Rubber World Magazine
(pdf)See the full Application Note (pdf).
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June 6, 2005--Wall Street Interviews Ambios
Technology
SANTA CRUZ, CA - Patrick O'Hara, President and CEO of Ambios
Technology, Inc. was interviewed by Robert Monteleona, Senior Analyst for the
Wall Street Reporter, as part of participation at a recent Nano Business 2005
forum, in New York City. Where industry, government and investment leaders
discussed the current and future business opportunities related to the emerging
field of nanotechnology. During the interview, Patrick O'Hara described the
current status of Ambios Technology, Inc. as a manufacturer of surface
measurement and analysis systems to the new and emerging field of
nanotechnology and nanoscience.
Mr. O'Hara cites books such as "Nanotech Fortunes - Make Yours
in the Boom" pointing out that the future of nanotechnology is still emerging
with a vast upside yet to come. "We manufacture the tools that allow
nanotechnologists to do the things that they do. Without our visualization and
analysis tools the people that are doing the science, the real scientists and
industrial researchers from universities, and other places really couldn't do
what they're doing."
Patrick states, "We are positioned well to help our clients
benefit from nanotechnology with competitive entry costs. The Reporter's
interview emphasizes that Wall Street is taking notice of us and our industry."
The Wall Street Reporter is an online and print news source
for investors both in private and publicly traded companies. This interview was
done in an effort to provide additional analysis for investors in the
nanotechnology sector. The Wall Street Reporter also provides additional
financial and investment analysis for a variety of markets.
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March 25, 2005--Ambios
Technology, Inc. Releases Powerful New Software For Metrology Tools
SANTA CRUZ, CA - The latest software release from Ambios
Technology, Inc. adds sophisticated automated features that improve
repeatability and time saving functions in use with their high resolution
optical profilers for the general industrial and academic marketplaces.
With the new software version (Version 5.5.2) an operator has
programming control to preset stage locations for repetitive measurements
integral to accurate data acquisition, timely throughput, and decreased errors
in operation. With the programmable stage preset functionality, an operator can
program up to ten stage positions ensuring repetitive measurements, and allow
easier sample interchanging without the need for reprogramming stage position
with every load. Other new features include: step detection, auto level, auto
measure, scan stitching, and multiple profile loads. These functions enable
operators to extend the profile range of the instrument, allowing larger scan
lengths, repeat multiple scans with the same parameters, and view analysis data
in "batch" format.
The move toward more automated capabilities is in part a
response to consumer requests in Research and Development and other markets, as
well as a continued company commitment to enhancing its surface analysis
products. Ambios Technology's profilers continue to be an ideal measurement
tool in the R&D world, as well as a capable tool in the MEMS and
nanotechnology fields.
November 19, 2004 -- Ambios Technology
Moves to New Corporate Headquarters and Expands Team
SANTA CRUZ, CA - In an economic time when many companies are
pulling in the reigns, Ambios Technology invested in its future by relocating
to a new corporate office with nearly three times more the amount of space. The
facility accommodates the growth the company is experiencing subsequent to the
recent release of their new product, the Xi-100 Non-Contact Surface Profiler.
The new facilities feature a new ESD compliant manufacturing space conducive to
their customer's clean room requirements, an application and engineering
laboratory, and expanded executive office space. The location also offers a key
space for product demonstrations to their global customer base.
Ambios Technology Established in 1996, Ambios Technology,
Inc. is a privately held company focused on surface measurement and
visualization at the nanoscale and is headquartered in California.
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