Profilometer Surface Roughness and Surface Finish Measurement

Software Highlights

XP-PROFILER SERIES

The XP series standard analysis software was designed to be easy to use and integrate smoothly into the laboratory and process environments. All of our instruments are compatible with third party software packages allowing for virtually limitless data analysis capabilities. Ambios Technology' s profiler software is compatible with the most current Windows operating system and USB communications interface and can be used at any authorized work station using our unlimited software site license. The analysis software provides a host of powerful tools, including:

  • Step height
  • Automatic step detection
  • Surface roughness and waviness
  • Film stress analysis
  • Programmable multi-point area profiling and profile stitching (XP-2)
  • Auto-level and auto measure (XP-2)
  • Over 30 standard calculation algorithms

Additional capabilities include user definable filters to isolate surface features such as: roughness or waviness. The data analysis interface provides a straight forward and intuitive process for acquiring measurements. ASCII data output makes analysis in alternate software possible with straight forward open format to import data to common spreadsheets or advanced graphing mathematics packages.

3D rendering software is available as an option with our XP-2 profiler (not available for XP-1). 3D rendering clearly illustrates surface profile features in tiff, jpg, bmp file formats, and can be saved in many standard graphic formats including gif, to meet 3D surface visualization needs.

Family

Xi-100 INTERFEROMETER

The Xi-100 software, like our XP stylus profiler products, is designed to be easy to use. The standard software gives the user simple analysis tools to quickly acquire useful measurements. The Xi-100 also integrates smoothly with 3rd party advanced analysis software and operates with the most current version of Windows operating system. Some of the powerful analysis tools include:

Standard Analysis Software
  • User-definable color mapping for 2D and 3D display
  • Histogram and area roughness measurements
  • Line profile and area analysis
  • Variety of data filters
  • Data leveling
  • Profile extraction from 2D images from any orientation
Advanced Analysis Software
  • Advanced data leveling / curvature subtraction
  • Advanced data filtering
  • Data resizing
  • User programmable batch processing
  • Profile extraction from 2D and 3D images from any orientation
  • Particle and grain analysis package


For SPM/AFM Software Downloads:

 

Latest ScanAtomic™ Software Downloads:

Release version 4.05.7/Alpha version 4.06.0: Note: This software upgrade will not work with Q-Systems currently running ScanAtomic version 3.24.x, or earlier. This is because the DSP card shipped in systems running the older software is incompatible with the required codetbl.dec file. However, it is possible replace the older DSP card with the newer version in order to run the newer ScanAtomic code . Please contact here for further information.

As of August 2005 the latest version available is v4.05.7 -- Latest changes / additions with version 4.05.7:

  • STM imaging modes added: STM log and STM linear feedback. STM Spectroscopy window has been added.

  • New Lithography Option features added to software.

  • FFT form has additional pattern-enhancing feature.

  • Wave Configuration window reworked to take advantage of new stageboard electronics capabilities.

  • Two different phase detectors (XOR and Synchronous) have been added for accurate phase locking and better phase imaging.

  • Send to Printer, and Send to Editor functions updated to work with Windows XP.

  • A user prompt has been added to the two-point calibration routines to verify changes in calibration data.

  • Miscellaneous improvements available upon request .

To install the latest version of the software follow these steps:

1) To be on the safe side, save your existing software by changing the name of program Afm.Exe to Afm.Bak and the name of file Codetbl.Dec to Codetbl.Bak. If a problem is encountered during the installation of the new software these copies can always be restored by reversing the name changes.

2) Download the latest version of these two files with this link (zipped file – 1.28MB).

3) If necessary, use Windows Explorer place the new Afm.Exe and Codetbl.Dec files into the product's SPM folder.

4) Update any existing shortcuts to the Afm.exe program.

5) When the new version of the ScanAtomic program is first executed you may encounter a series of messages informing you that no spm.ini file entry exists for certain software parameters, and default values will be used. This situation is normal. It occurs because the newer software makes use of parameters which did not exist with the older version. Press “OK” for all of these messages and then open the SPM Configuration window. Clicking “Download” will store several of the missing parameters. To store the rest of the missing parameters, open the Advanced Scan Parameters window and press “Update”. Now when you launch the software again the missing parameter messages will no longer appear.

Alpha version 4.06.0 available: An alpha version of ScanAtomic version 4.06.0 is also available. This has several new software control features not yet available in current ScanAtomic releases. For further information, or to request a copy of the alpha 4.06.0 software contact us here.

 

For more information contact us here.