Software Highlights


XP-PROFILER SERIES SOFTWARE

The XP series standard analysis software was designed to be easy to use and integrate smoothly into the laboratory and process environments. All of our instruments are compatible with third party software packages allowing for virtually limitless data analysis capabilities. Ambios Technology' s profiler software is compatible with the most current Windows operating system and USB communications interface and can be used at any authorized work station using our unlimited software site license. The analysis software provides a host of powerful tools, including:

  • Step height
  • Automatic step detection
  • Surface roughness and waviness
  • Film stress analysis
  • Programmable multi-point area profiling and profile stitching (XP-2)
  • Auto-level and auto measure (XP-2)
  • Over 30 standard calculation algorithms

Additional capabilities include user definable filters to isolate surface features such as: roughness or waviness. The data analysis interface provides a straight forward and intuitive process for acquiring measurements. ASCII data output makes analysis in alternate software possible with straight forward open format to import data to common spreadsheets or advanced graphing mathematics packages.





Xi-100 PLUS INTERFEROMETER SOFTWARE

The Xi-100 software, like our XP stylus profiler products, is designed to be easy to use. The standard software gives the user simple analysis tools to quickly acquire useful measurements. The Xi-100 also integrates smoothly with 3rd party advanced analysis software and operates with the most current version of Windows operating system. Some of the powerful analysis tools include:

Standard Analysis Software
  • User-definable color mapping for 2D and 3D display
  • Histogram and area roughness measurements
  • Line profile and area analysis
  • Variety of data filters
  • Data leveling
  • Profile extraction from 2D images from any orientation
Advanced Analysis Software
  • Advanced data leveling / curvature subtraction
  • Advanced data filtering
  • Data resizing
  • User programmable batch processing
  • Profile extraction from 2D and 3D images from any orientation
  • Particle and grain analysis package

For more information contact us here.