© Ambios Technology, Inc. All rights reserved.
Whether you are a researcher looking to measure: surface flatness, surface waviness, surface quality, surface topography, and/or surface characterization, the XP profilometer addresses surface finish metrology measurement for a variety of results achieved via surface scanning of substrates, surface texture management, surface imaging, and surface technology. Acting as a surface roughness gauge, tester and inspection system; our surface technology utilizes the highest level of industry parameters and standards.
The XP and Xi-100 equipment helps with roughness measurement definition in the Micro-Electro-Mechanical Systems (MEMS) industry, in MEMS applications, and MEMS metrology using technology equipment for semiconductor and wafer surface metrology. Substances of all kinds are measured, from metal to glass, creating the conversion and assessment of results to useful data. Ambios Technology equipment has become a symbol of dependable and cost effective roughness measurement.
The XP profilometer equipment is a precision industrial metrology technology instrument, precision metrics tool, inspection apparatus, product resource system and solution offering metrology calibration instrumentation for height measurement; ra surface finish roughness, rms surface finish roughness and rz surface finish testing.
Metrology Definition: (mètro'logy) noun 1. The science of weights and measures. 2. A system of weights and measures. Definition from: The Oxford Dictionary, Sixth edition, 1978


