• Patented Isotopic Focal System™ permits 90 degree top-down view for easy alignment and positioning of the probe as well as tracking of cantilever/probe during scanning for increased sensitivity and elimination of laser light reflections from the sample.
• Patented Analoop™ analog PID feedback loop that is digitally controlled which has no digital quantizing errors and an extremely fast sampling frequency.
• Interchangeable Q-Scan™ AFM scanning assemblies offer scan ranges from 20um to 200um in X and Y and up to 17 um in Z. Dual tube scanners eliminate crosstalk between X, Y, and Z axes and are inherently more linear.
• The Metrology option adds closed loop positioning sensors to all 3 axes. Accuracy is within 0.2% in X and Y, and within 1.0% in Z.
• User interfaces are implemented in a Windows XP graphical environment with easy-to-use controls for fast laser intensity optimization, graphical display of the SofTouch™ approach to sample, and for setting of all operating parameters (scan rate, scan size, resolution, zoom, scan rotation, feedback signal, signal gain, etc.).

• Scanning at rates as high as 20Hz are possible, greatly reducing data acquisition times. With Broadband Mode, the error signal generated by the shifts in cantilever angle during scanning is used to correct the scan data collected at high speed.
• Q-Lithic™ stage features solid granite base and support arch for excellent mechanical and thermal stability. Additional damping of environmental noise is achieved with the optional Acoustic/Vibration Isolation Chamber.
• Options and Accessories available for our SPMs ranges from closed-loop metrology scanners to Nanolithography software, or from combined SPM/Hysitron tribology capabilities to liquid cells and cantilevers.
• With the Q-Scope™, easy-to-use controls permit rapid probe exchange and alignment, sample approach, and intuitive display and adjustment of all SPM operating parameters. Manual or motorized X-Y and R, Theta sample translation stages are available with automated scanning and storage of data from multiple areas on the sample (e.g. on patterned wafers).

  Virtually all AFM imaging modes, including WaveMode™ intermittent-contact mode, which can capture topographic, lateral force, phase, magnetic and force-distance curves are standard.

Related Documents:

• Q-scope Brochure (PDF)
• Q-scope Software Highlights
• Image Gallery
• Purchase a Q-scope