• 250X video microscope with 90 degree top-down view for easy alignment and positioning of the AFM probe. Tip and surface view is 45 degrees during STM operation.
• Easy-to-use controls permit rapid probe exchange and alignment, sample approach, and intuitive display and adjustment of all SPM operating parameters. There is a micrometer-driven X-Y translation of the scan head over the sample.
• Virtually all AFM imaging modes, including WaveModeTM intermittent-contact mode, which can capture topographic, lateral force, phase, magnetic and force- distance curves are standard.
• Patented Analoop™ analog PID feedback loop that is digitally controlled which allows more accurate data gathering and has an extremely fast sampling frequency.

• Interchangeable scanning modules offer scan ranges from 500nm to 80um. The Metrology option adds closed loop positioning sensors to all 3 axes. Accuracy is within 0.2% in X and Y, and within 1.0% in Z.
• User interfaces are implemented in a Windows XP graphical environment with easy-to-use controls for fast laser intensity optimization, graphical display of the SofTouch™ computer-controlled Z-axis approach to sample, and for setting of all operating parameters (scan rate, scan size, resolution, zoom, scan rotation, feedback signal, signal gain, etc.).
• Scanning at rates as high as 20Hz are possible, greatly enhancing data acquisition times. With Broadband Mode, the error signal generated by the shifts in cantilever angle during scanning is used to correct the scan data collected at high speed.
• Options and Accessories available for our SPMs ranges from closed-loop metrology scanners to Nanolithography software, or from combined SPM/Hysitron tribology capabilities to liquid cells and cantilevers.

Related Documents:

• USPM Brochure (PDF)
• USPM Software Highlights
• Image Gallery
• Purchase a Q-scope USPM