Q-Scope Series Research-Grade Scanning Probe Microscopes are designed for industrial and academic research applications requiring precise positioning of the probe, and the best possible accuracy in measuring surface feature dimensions. All Q-scope models have the ability to operate in virtually all conventional scan modes and can have the ability to perform nanolithography. Closed-loop metrology scanners are available for all models. 

XP Series High Resolution Stylus-Type Surface Profilometers incorporate advanced proprietary technology in its force control mechanism and height-measurement sensors to minimize tip/sample interaction. The well thought out design includes elegant sample handling and optical viewing. These Profilers deliver sub-nanometer vertical resolution with stylus loads as low as 0.05mg. These instruments easily integrate in contemporary lab networks via standard USB communications and MS office work protocols.